Author:
Kim B.,Shin H.,Chun J.-H.,Abraham J.A.
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference22 articles.
1. Hashempour, H., Meyer, F.J., and Lombardi, F.: ‘Analysis and measurement of fault coverage in a combined ate and bist environment’, Transactions on Instrumentation and Measurement, (IEEE 2004), p. 300–307
2. Burns, M., and Roberts, G.W.: ‘An introduction to mixed-signal IC test and measurement’, (OXFORD univ. press 2001 March), p. 550
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