Author:
Kim Byoungho,Abraham Jacob A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
9 articles.
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1. One-Bit Sine-Fit;IEEE Transactions on Instrumentation and Measurement;2021
2. Frequency and Amplitude Domain DAC-ADC Co-Testing Using Ternary Signals;IEEE Transactions on Instrumentation and Measurement;2020-07
3. Research on Multi-domain Mixed Analysis Technology of Communication Signals;Proceedings of the 6th International Conference on Communications and Broadband Networking - ICCBN 2018;2018
4. Efficient Signature-Driven Self-Test for Differential Mixed-Signal Circuits;JSTS:Journal of Semiconductor Technology and Science;2016-10-30
5. Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications;IEEE Transactions on Circuits and Systems II: Express Briefs;2016-02