Single event transient tolerant frequency divider
Author:
Affiliation:
1. School of MicroelectronicsFudan University825 Zhangheng RoadShanghai201203People's Republic of China
2. GPIX IncBeijing office18 Yumin RoadBeijing100029People's Republic of China
Funder
National Natural Science Foundation of China
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-cdt.2013.0132
Reference28 articles.
1. Soft errors in advanced computer systems;Baumann R.;IEEE Trans. Device Mater. Reliab.,2005
2. Characterization of soft errors caused by single event upsets in CMOS processes
3. Analysis and design of nanoscale CMOS storage elements for single‐event hardening with multiple‐node upset;Sheng L.;IEEE Trans. Device Mater. Reliab.,2012
4. Wang L. Yue S. Zhao Y. Fan L.: ‘An SEU‐tolerant programmable frequency divider’.Proc. Eighth Int. Symp. Quality Electronic Design 2007 pp.899–904
5. Fine‐grain SEU mitigation for FPGAs using partial TMR;Pratt B.;IEEE Trans. Nucl. Sci.,2008
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