Author:
Chen Y.-H.,Chang C.-L.,Wen C.H.-P.
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
10 articles.
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1. A Storage Based LBIST Scheme for Logic Diagnosis;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. New Targets for Diagnostic Test Generation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
3. Locating Open-Channels in Octagon Networks on Chip-Microprocessors;2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2020-07
4. Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks;Journal of Electronic Testing;2020-04-27
5. Diagnostic Test Generation That Addresses Diagnostic Holes;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-02