Wavelength dependent propagation loss characteristics of SiGe/Si planar waveguides
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19921425?crawler=true&mimetype=application/pdf
Reference6 articles.
1. Steeds, J.W.: Hrea, J.H., Goldstein, J.I., Joy, D.C., Introduction to practical electron microscopy, (Plenum Press, NY 1979), p. 387–423
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