Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Reference7 articles.
1. Defect classes-an overdue paradigm for CMOS IC testing
2. Three-dimensional transient thermal simulation: application to delayed short circuit protection in power ICs
3. Rodriguez, R.: ‘Caracteritzaciti electrica de circuits CMOS digitals amb defectes tipus pont: Implicacions al test per corrent quiescent’, 1992, PhD, Universitat Politècnica de Catalunya Electronic Engineering Department Barcelona Spain
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