Comparative reliability study of GaAs power MESFETs: mechanisms for surface-induced degradation and a reliable solution
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19850080?crawler=true&mimetype=application/pdf
Reference8 articles.
1. Irvin, J.C.: ‘The reliability of GaAs FETs’, Di Lorenzo, I.V., Khandelwal, D.D., GaAs FET principles and technology, (Dedham, Ma. 1982), p. 349–400
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