MOS noise performance under impedance matching constraints-Reference-Cited by-同舟云学术

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MOS noise performance under impedance matching constraints

Published:1999 Issue:15 Volume:35 Page:1278
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. Lett.

Author:

Janssens J.,Steyaert H.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/el_19990837?crawler=true&mimetype=application/pdf

Reference3 articles.

1. Lee, T.H.: ‘The design of CMOS radio-frequency integrated circuits’, (Cambridge University Press 1998), p. 281–284

2. Optimum MOS power matching by exploiting non-quasistatic effect

3. Tsividis, Y.P.: ‘Operation and inodelling of the MOS transistor’, (McGraw-Hill 1987),6, p. 399

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4. RF-ESD Co-Design for High Performance CMOS LNAs;Analog Circuit Design;2003

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