Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques-Reference-Cited by-同舟云学术

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Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques

Published:1996 Issue: Volume: Page:
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Container-title:Seventh International Conference on Dielectric Materials, Measurements and Applications
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Author:

Krupka J.

Publisher

IEE

Cited by 64 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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