Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Cited by
34 articles.
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1. Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2016-05
2. Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-02
3. Gate Leakage Impact on Full Open Defects in Interconnect Lines;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2011-12
4. Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2011-12
5. Open Defects in Nanometer Technologies;Models in Hardware Testing;2009-10-27