Extracting characteristic impedance in low-loss substrates
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el.2010.2532?crawler=true&mimetype=application/pdf
Reference7 articles.
1. Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer
2. Characteristic impedance extraction using calibration comparison
3. Characteristic impedance determination using propagation constant measurement
4. On-chip SiGe transmission line measurements and model verification up to 110 GHz
5. Broadband Material Parameter Characterization for Practical High-Speed Interconnects on Printed Circuit Board
Cited by 31 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Determining the Permittivity of a PCB Dielectric Using Striplines Considering Copper Roughness;IEEE Microwave and Wireless Technology Letters;2024
2. Identifying and Modeling Resonance-Related Fluctuations on the Experimental Characteristic Impedance for PCB and On-Chip Transmission Lines;Electronics;2023-07-07
3. Electrically induced directional self-focusing in electrochromic NiO thin solid films;Journal of Materials Science: Materials in Electronics;2023-04
4. Influence of Asymmetric Agglomerations Effects over the Photothermal Release of Liposome-Encapsulated Nanodiamonds Assisted by Opto-Mechanical Changes;Symmetry;2023-03-22
5. Photonic encryption by optical activity in Kerr-like carbon-based nanofluids with plasmonic nanoparticles;Journal of Molecular Liquids;2022-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3