Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el.2010.2885?crawler=true&mimetype=application/pdf
Reference8 articles.
1. Ben Dhia, S., Ramdani, M., and Sicard, E.: ‘Electromagnetic compatibility of integrated circuits’, (Springer 2005),ISBN 0-387-26600-3
2. Parker, W.H. and Tustin, W.: ‘The case for combining EMC and environmental testing’, ITEM 2002, pp. 54–60, 2002
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