Construction method of BBC and its implementation
Author:
Affiliation:
1. School of Electronic and Information EngineeringAnhui Jianzhu UniversityAnhuiPeople's Republic of China
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/el.2015.3940
Reference9 articles.
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2. Low transition test pattern generator architecture for built‐in‐self‐test;Sakthivel P.;Am. J. Appl. Sci.,2012
3. Test pattern generator (TPG) for low power logic built‐in‐self‐test (BIST);Hussian S.;Int. J. Adv. Res. Electr. Electron. Instrum. Eng.,2013
4. Low transition test pattern generation for BIST‐based applications;Nourani M.;IEEE Trans. Comput.,2008
5. Bit‐swapping LFSR and low‐power BIST;Abu‐Issa A.S.;Electron. Lett.,2008
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