Design for security test against fault injection attacks-Reference-Cited by-同舟云学术

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Design for security test against fault injection attacks

Published:2014-11 Issue:23 Volume:50 Page:1677-1678
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. lett.

Author:

Shao Cuiping¹,Li Huiyun¹,Xu Guoqing¹,Xiong Liying²

Affiliation:

1. Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, The Chinese University of Hong KongShenzhenPeople's Republic of China

2. School of Information EngineeringSouthwest University of Science and TechnologyMianyangPeople's Republic of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/el.2014.1666

Reference5 articles.

1. Fault Injection Attacks on Cryptographic Devices: Theory, Practice, and Countermeasures

2. On the Importance of Eliminating Errors in Cryptographic Computations

3. Differential Cryptanalysis of the Data Encryption Standard

4. The Sorcerer's Apprentice Guide to Fault Attacks

5. Secure Scan: A Design-for-Test Architecture for Crypto Chips

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