Author:
Baker Mark A.,Bacon S.R.,Sweeney S.J.,Hinder Steven J.,Bushell A.,Nunney T.S.,White R.G.
Reference51 articles.
1. The Development of Commercial ESCA Instrumentation: A Personal Perspective;M Kelly;J. Chem. Educ,2004
2. Use of Auger Electron Spectroscopy and Inert Gas Sputtering for Obtaining Chemical Profiles;P W Palmberg;J. Vacuum Sci. Technol,1972
3. Sputter-depth Profiling for Thin Film Analysis;S Hofmann;Phil. Trans. R. Soc. Lond. A,2004