Progress in the Preparation of Cross-Sectional TEM Specimens by Ion-Beam Thinning-Reference-Cited by-同舟云学术

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Progress in the Preparation of Cross-Sectional TEM Specimens by Ion-Beam Thinning

Published:2003-03 Issue:3 Volume:94 Page:290-297
ISSN:0044-3093
Container-title:Zeitschrift für Metallkunde
language:en
Short-container-title:MEKU

Author:

Strecker Adolf,Bäder Ute,Kelsch Marion,Salzberger Ute,Sycha Maria,Gao Min,Richter Gunther,van Benthem Klaus

Publisher

Walter de Gruyter GmbH

Subject

Metals and Alloys

Reference24 articles.

1. Transmission Electron Microscopy

2. Transmission Electron Microscopy

3. Electron Energy-Loss Spectroscopy in the Electron Microscope

4. A. Dietzel, A. Jakubowicz, R.F. Broom, in: Proceedings of Microscopy of Semiconducting Materials, A.G. Cullis, A.E. Staton-Bevan (Eds.), IOP Publishing, Oxford (1995) 583.

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