An RRAM retention prediction framework using a convolutional neural network based on relaxation behavior

Author:

Zhang YibeiORCID,Zhang QingtianORCID,Qin Qi,Zhang Wenbin,Xi YueORCID,Jiang Zhixing,Tang Jianshi,Gao BinORCID,Qian He,Wu Huaqiang

Abstract

Abstract The long-time retention issue of resistive random access memory (RRAM) brings a great challenge in the performance maintenance of large-scale RRAM-based computation-in-memory (CIM) systems. The periodic update is a feasible method to compensate for the accuracy loss caused by retention degradation, especially in demanding high-accuracy applications. In this paper, we propose a selective refresh strategy to reduce the updating cost by predicting the devices’ retention behavior. A convolutional neural network-based retention prediction framework is developed. The framework can determine whether an RRAM device has poor retention that needs to be updated according to its short-time relaxation behavior. By reprogramming these few selected devices, the method can recover the accuracy of the RRAM-based CIM system effectively. This work provides a valuable retention coping strategy with low time and energy costs and new insights for analyzing the physical connection between the relaxation and retention behavior of the RRAM device.

Funder

the Center of Nanofabrication, Tsinghua University

the XPLORER Prize

National Natural Science Foundation of China

Ministry of Science and Technology (MOST) of China

Publisher

IOP Publishing

Subject

Psychiatry and Mental health,Neuropsychology and Physiological Psychology

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