Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric film-Reference-Cited by-同舟云学术

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Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric film

Published:2016-06-09 Issue:7 Volume:31 Page:075004
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Choi Chul-Min,Oh Young-Taek,Kim Kyung-Jun,Park Jin-Suk,Sukegawa Hiroaki,Mitani Seiji,Kim Sung-Kyu,Lee Jeong-Yong,Song Yun-Heub

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0268-1242/31/i=7/a=075004/pdf

Reference31 articles.

1. Measurement of the spin-transfer-torque vector in magnetic tunnel junctions

2. Device implications of spin-transfer torques

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4. Thermal Plasma Synthesis of Ceramic Nanomaterials;Applied Science and Convergence Technology;2020-09-30

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