REBIC-SEM characterisation of compound semiconductors
Author:
Publisher
IOP Publishing
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0268-1242/7/i=1A/a=028/pdf
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1. Charge collection scanning electron microscopy
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4. Observation of charge‐separating defects in HgCdTe using remote contact electron beam induced current
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