Assessment of photovoltaic junction position using combined focused ion beam and electron beam‐induced current analysis of close space sublimation deposited CdTe solar cells-Reference-Cited by-同舟云学术

Assessment of photovoltaic junction position using combined focused ion beam and electron beam‐induced current analysis of close space sublimation deposited CdTe solar cells

Published:2014-06-02 Issue:10 Volume:22 Page:1096-1104
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog. Photovolt: Res. Appl.

Author:

Major Jonathan Douglas¹,Bowen Leon²,Treharne Robert¹,Durose Ken¹

Affiliation:

1. Stephenson Institute for Renewable Energy, School of Physical Sciences, Chadwick Building University of Liverpool Liverpool L69 7ZF UK

2. GJ Russell Microscopy Facility, Faculty of Science University of Durham Durham DH1 3LE UK

Funder

EPSRC

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pip.2507

Reference21 articles.

1. EBIC and luminescence mapping of CdTe/CdS solar cells

2. Characterisation of thin film CdS/CdTe solar cells using electron and optical beam induced current

3. DuroseK SadlerJRE YatesA SzczerbakowA IEEE.R‐EBIC study of the electrical activity of grain boundaries in CdTe and Cd(S Te).Proceedings of the 28thIEEE Photovoltaic Specialists Conference IEEE New York 2000;487–490.

4. REBIC-SEM characterisation of compound semiconductors

5. Physical characterization of thin-film solar cells

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