Low-frequency noise used as a lifetime test of LEDs
Author:
Publisher
IOP Publishing
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. Electrical Noise as a Measure of Quality and Reliability in Electronic Devices
2. 1/f noise as a reliability estimation for solar cells
3. An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers
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