An inverse problem of charge-collection microscopy
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Computer Science Applications,Mathematical Physics,Signal Processing,Theoretical Computer Science
Link
https://iopscience.iop.org/article/10.1088/0266-5611/2/3/001/pdf
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1. Charge collection scanning electron microscopy
2. Investigation of minority‐carrier diffusion lengths by electron bombardment of Schottky barriers
3. Determination of Semiconductor Parameters and of the Vertical Structure of Devices by Numerical Analysis of Energy-Dependent EBIC Measurements
4. Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials
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