Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry-Reference-Cited by-同舟云学术

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Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry

Published:2015-11-18 Issue:1 Volume:18 Page:015401
ISSN:2040-8978
Container-title:Journal of Optics
language:
Short-container-title:J. Opt.

Author:

Nečas D,Ohlídal I,Franta D,Ohlídal M,Vodák J

Funder

European Regional Development Fund

Technological Agency of Czech Republic

Publisher

IOP Publishing

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference54 articles.

1. One-dimensional II–VI nanostructures: Synthesis, properties and optoelectronic applications

2. Analysis of the electrical characteristics of Zn/ZnSe/n-Si/Au–Sb structure fabricated using SILAR method as a function of temperature

3. Synthesis of thermally evaporated ZnSe thin film at room temperature

4. Optical constants and fitted transmittance spectra of varies thickness of polycrystalline ZnSe thin films in terms of spectroscopic ellipsometry

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures;Micromachines;2022-07-07

2. Mapping and Imaging of Thin Films on Large Surfaces;physica status solidi (a);2022-05-26

3. Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization;Coatings;2020-12-27

4. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry;Applied Surface Science;2020-12

5. Data Processing Methods for Imaging Spectrophotometry;Optical Characterization of Thin Solid Films;2018

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