Modifying ultrafast optical response of sputtered VOX nanostructures in a broad spectral range by altering post annealing atmosphere-Reference-Cited by-同舟云学术

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Modifying ultrafast optical response of sputtered VOX nanostructures in a broad spectral range by altering post annealing atmosphere

Published:2014-12-17 Issue:1 Volume:17 Page:015503
ISSN:2040-8978
Container-title:Journal of Optics
language:
Short-container-title:J. Opt.

Author:

Kürüm U,Yaglioglu H G,Küçüköz B,Oksuzoglu R M,Yıldırım M,Yağcı A M,Yavru C,Özgün S,Tıraş T,Elmali A

Funder

Scientific and Technological Research Council of Turkey (TUBITAK)

Publisher

IOP Publishing

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/2040-8986/17/i=1/a=015503/pdf

Reference27 articles.

1. PassiveQswitching and mode‐locking of Er:glass lasers using VO2mirrors

2. Controlled diffractive optical elements containing a vanadium dioxide film

3. Optical switching of vanadium dioxide thin films deposited by reactive pulsed laser deposition

4. Intelligent Window Coatings: Atmospheric Pressure Chemical Vapor Deposition of Tungsten-Doped Vanadium Dioxide

5. Ultrafast insulator-to-metal phase transition as a switch to measure the spectrogram of a supercontinuum light pulse

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The evolution of nanoscale pores with post-annealing and the structure-electrical property correlation in vanadium oxide thin films;Thin Solid Films;2022-02

2. Tuning thermochromic performance of VOx-based multilayer films by controlling annealing pressure;Ceramics International;2020-02

3. Impact of Annealing Temperature on Spin Coated V2O5 Thin Films as Interfacial Layer in Cu/V2O5/n-Si Structured Schottky Barrier Diodes;Journal of Inorganic and Organometallic Polymers and Materials;2019-03-08

4. Vanadium Oxide Thin Films Obtained by Thermal Annealing of Layers Deposited by RF Magnetron Sputtering at Room Temperature;Modern Technologies for Creating the Thin-film Systems and Coatings;2017-03-08

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