Dual wavelength optical metrology using ptychography-Reference-Cited by-同舟云学术

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Dual wavelength optical metrology using ptychography

Published:2013-01-29 Issue:3 Volume:15 Page:035702
ISSN:2040-8978
Container-title:Journal of Optics
language:
Short-container-title:J. Opt.

Author:

Claus D,Robinson D J,Chetwynd D G,Shuo Y,Pike W T,De J Toriz Garcia José J,Rodenburg J M

Publisher

IOP Publishing

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/2040-8986/15/i=3/a=035702/pdf

Reference23 articles.

1. Beugung im inhomogenen Primärstrahlwellenfeld. I. Prinzip einer Phasenmessung von Elektronenbeungungsinterferenzen

2. A phase retrieval algorithm for shifting illumination

3. Phase retrieval with transverse translation diversity: a nonlinear optimization approach

4. Probe retrieval in ptychographic coherent diffractive imaging

5. An improved ptychographical phase retrieval algorithm for diffractive imaging

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Momentum Fourier ptychographic topography;Optics and Lasers in Engineering;2024-09

2. Nd:YVO₄/YVO₄ cascaded Raman laser pumped dual-wavelength signal wave MgO:PPLN-OPO with wide range adjustable wavelength interval;Optics Express;2024-04-30

3. At-focus scanning ptychography for high resolution imaging with a wide field of view;Optics Express;2024-02-08

4. Maximum-likelihood estimation in ptychography in the presence of Poisson–Gaussian noise statistics;Optics Letters;2023-11-14

5. Broadband ptychographic imaging with an accurately sampled spectrum;Physical Review A;2023-03-20

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