1. Defect Inspection Techniques in SiC;Chen;Nanoscale Res Lett,2022
2. Optical wafer defect inspection at the 10 nm technology node and beyond;Zhu;Int J Extreme Manuf,2022
3. Characterization Techniques for Topography Analysis;Hosseinian;Mat Char Tech and Appl Prog in Opt Sci and Phot,2022
4. Atomic force microscopy analysis of surface topography of pure thin aluminum films;Mwema;Mater Res Express,2018
5. Topography inversion in scanning tunneling microscopy of single-atom-thick materials from penetrating substrate states;Park;Sci Rep,2022