Epioptics: linear and non-linear optical spectroscopy of surfaces and interfaces
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/2/i=40/a=001/pdf
Reference95 articles.
1. In situ characterization by reflectance difference spectroscopy of III–V materials and heterojunctions grown by low pressure metal organic chemical vapour deposition
2. Azimuthally resolved optical second-harmonic generation from hydrogen on nickel (111)
3. Antimony adsorption on silicon (111) analyzed in real time by in situ ellipsometry
4. Above-bandgap optical anisotropies in cubic semiconductors: A visible–near ultraviolet probe of surfaces
5. High Precision Scanning Ellipsometer
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