Author:
Low M H S,Huan C H A,Wee A T S,Tan K L
Subject
Condensed Matter Physics,General Materials Science
Cited by
5 articles.
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1. Ionization in symmetric and nearly symmetric low energy ion–surface collisions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-11
2. Secondary ion emission from Ti, V, Cu, Ag and Au surfaces under KeV Cs+ irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-02
3. Transient effects in SIMS analysis of Si with Cs+ at high incidence angles: Secondary ion yield variations;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-10
4. Dynamical screening effects in surface ionization of mono(di)atomic fragmentation: A finite size approach;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-06
5. Cesium-induced transient effects on the Si+ and Si− secondary ion emissions from Si and SiO2;Surface Science;2000-02