NiO as a test case for high resolution resonant inelastic soft x-ray scattering-Reference-Cited by-同舟云学术

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NiO as a test case for high resolution resonant inelastic soft x-ray scattering

Published:2005-08-19 Issue:35 Volume:17 Page:5397-5412
ISSN:0953-8984
Container-title:Journal of Physics: Condensed Matter
language:
Short-container-title:J. Phys.: Condens. Matter

Author:

Ghiringhelli G,Matsubara M,Dallera C,Fracassi F,Gusmeroli R,Piazzalunga A,Tagliaferri A,Brookes N B,Kotani A,Braicovich L

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

Link

http://stacks.iop.org/0953-8984/17/i=35/a=007/pdf

Reference49 articles.

1. Resonant Inelastic X-Ray Scattering inNd2CuO4

2. X-ray resonant Raman scattering in NiO: Resonant enhancement of the charge-transfer excitations

3. Charge transfer at very high pressure in NiO

4. Unique identification of Zhang-Rice singlet excitation inSr2CuO2Cl2mediated by the O1score hole: Symmetry-selective resonant soft x-ray Raman scattering study

5. Low Energy Electronic Excitations in the Layered Cuprates Studied by CopperL3Resonant Inelastic X-Ray Scattering

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