Self-assembling and ordering of Ge/Si(111) quantum dots: scanning microscopy probe studies
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/14/i=35/a=308/pdf
Reference90 articles.
1. In touch with atoms
2. Scanning tunneling microscopy of semiconductor surfaces
3. Simultaneous molecular beam epitaxy growth and scanning tunneling microscopy imaging during Ge/Si epitaxy
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