Observation and control of Si surface and interface processes for nanostructure formation by scanning reflection electron microscopy
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Reference20 articles.
1. Reflection electron microscopy: studies of surface structures and surface dynamic processes
2. LEEM studies of the early stages of epitaxial growth
3. Secondary electron imaging of monolayer steps on a clean Si(111) surface
4. Crystallographic analysis and observation of surface micro-areas using microprobe reflection high-energy electron diffraction
5. Scanning reflection electron microscopy and associated techniques for surface studies
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