Deep-level defects at lattice-mismatched interfaces in GaAs-based heterojunctions
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Reference14 articles.
1. Dislocations in strained-layer epitaxy: theory, experiment, and applications
2. Deep-Level Defects at Lattice-Mismatched GaAsSb/GaAs Interface
3. Direct Measurement of Very Short Minority‐Carrier Diffusion Lengths in Semiconductors
4. Electron‐Beam Excited Minority‐Carrier Diffusion Profiles in Semiconductors
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