A diamond-tip probe with silicon-based piezoresistive strain gauge for high-density data storage using scanning nonlinear dielectric microscopy-Reference-Cited by-同舟云学术

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A diamond-tip probe with silicon-based piezoresistive strain gauge for high-density data storage using scanning nonlinear dielectric microscopy

Published:2006-07-10 Issue:8 Volume:16 Page:1620-1624
ISSN:0960-1317
Container-title:Journal of Micromechanics and Microengineering
language:
Short-container-title:J. Micromech. Microeng.

Author:

Takahashi Hirokazu,Ono Takahito,Onoe Atsushi,Cho Yasuo,Esashi Masayoshi

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. The "millipede" - nanotechnology entering data storage

2. Scanning nonlinear dielectric microscope

3. Scanning Nonlinear Dielectric Microscope Using a Lumped Constant Resonator Probe and Its Application to Investigation of Ferroelectric Polarization Distributions

4. Ultrahigh-Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy

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1. Comparison of Al and Cu masks used for patterning boron-doped diamonds in oxygen plasma;Journal of Micromechanics and Microengineering;2019-11-04

2. Investigation of Mechanical and Tribological Properties of Polyaniline Brush by Atomic Force Microscopy for Scanning Probe-Based Data Storage;e-Journal of Surface Science and Nanotechnology;2013

3. Probe Storage;Memory Mass Storage;2010-11-30

4. The fabrication of metallic tips with a silicon cantilever for probe-based ferroelectric data storage and their durability experiments;Nanotechnology;2009-08-18

5. Encapsulated tips for reliable nanoscale conduction in scanning probe technologies;Nanotechnology;2009-02-17

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