Compact modeling of short-channel effects in back-gated 2D negative capacitance (NC) FETs

Abstract

Abstract The negative capacitance field-effect transistor with 2D channel material (2D NC-FET) holds significant promise for low-power applications owing to its remarkable resilience against short-channel effects (SCEs) and favorable noise characteristics. In this study, we establish a compact current–voltage (I–V) model for short-channel back-gated 2D NC-FETs with metal-ferroelectric-metal–insulator–semiconductor structure by self-consistently solving the two-dimensional Poisson, drift–diffusion and Landau–Khalatnikov equations. The proposed model is valid and continuous throughout the entire operating regime, including the fully-depleted region, partly-depleted region, and accumulation region. Furthermore, we derive analytical equations for the threshold voltage ( V TH ) and subthreshold swing ( SS ) of back-gated 2D NC-FETs based on the developed I–V model. Lastly, we elucidate the influence mechanisms of various device parameters and voltage bias on the subthreshold characteristics of short-channel back-gated 2D NC-FETs using the proposed I–V model in conjunction with analytical expressions of V T H and SS . Our findings reveal that back-gated 2D NC-FETs shows unconventional degradation behavior in V TH and SS, resulting from the competition between traditional SCEs and novel negative capacitance effects.