Impact of local electrostatic field rearrangement on field ionization-Reference-Cited by-同舟云学术

Impact of local electrostatic field rearrangement on field ionization

Published:2018-02-19 Issue:10 Volume:51 Page:105601
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Katnagallu Shyam^ORCID,Dagan Michal,Parviainen Stefan,Nematollahi Ali,Grabowski Blazej,Bagot Paul A J,Rolland Nicolas,Neugebauer Jörg,Raabe Dierk,Vurpillot François,Moody Michael P,Gault Baptiste^ORCID

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://iopscience.iop.org/article/10.1088/1361-6463/aaaba6/pdf

Reference42 articles.

1. Study of Atomic Structure of Metal Surfaces in the Field Ion Microscope

2. Study of interfaces by field-ion microscopy

3. A field ion microscope study of atomic configuration at grain boundaries

4. Diffusion of individual adatoms

5. Surface Diffusion

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