Study of interfaces by field-ion microscopy-Reference-Cited by-同舟云学术

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Study of interfaces by field-ion microscopy

Published:1973-05 Issue:5 Volume:27 Page:1169-1173
ISSN:0031-8086
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Smith D. A.

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786437308225824

Reference28 articles.

1. Crystal Defects and Crystalline Interfaces

2. Determination of the plane of a grain boundary from a field-ion micrograph

3. The accurate determination of crystal orientation from field ion micrographs

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Impact of local electrostatic field rearrangement on field ionization;Journal of Physics D: Applied Physics;2018-02-19

2. Studies of dislocations by field ion microscopy and atom probe tomography;Philosophical Magazine;2013-09-30

3. The simulation of images in the field ion microscope: Specimens of arbitrary crystal structure and orientation;Journal of Applied Physics;1982-02

4. Grain boundary dislocation observations using the field ion microscope;Physica Status Solidi (a);1981-06-16

5. Field-on microscopy observations of ordered grain boundary structures in tungsten;Scripta Metallurgica;1974-03

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