Abstract
Abstract
One of the most fundamental and challenging tasks to achieve high-performance ultra-thin atomic field effect transistors (FETs) is to obtain very low or even zero Schottky barrier height (SBH) at source/drain contact. Here, we propose that heteroatom substitution is an effective strategy to tune the performance of two-dimensional materials-based FETs, which is demonstrated by systematically exploring the effects of Se substitution on the structural and electronic properties, and SBH of MoS
x
Se(2−x)/graphene (MoS
x
Se(2−x)/G) heterostructures using first-principles calculations. Our findings suggest that the type and height of Schottky barrier can be adjusted by varying Se concentration. The transformation from n-type Schottky barrier to p-type Schottky barrier can be realized when the Se concentration is greater than 25%. With the increase of Se concentration, a lower p-type Schottky barrier can be obtained at the interface to achieve efficient charge transfer. Moreover, the Schottky barrier of MoS
x
Se(2−x)/G heterostructures with different Se concentration would disappear as the external electric field exceeds certain values. These results would provide a direction in developing high-performance FETs involving heteroatom substitution layers as contact electrodes.
Funder
National Natural Science Foundation of China
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
5 articles.
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