Abstract
Abstract
The electric breakdown characteristics in microcavity structure under repeated frequency pulse (RFP) were studied, and the physical mechanism was investigated quantitatively based on the full statistical distribution of breakdown time delay obtained in step rectangular pulse (SRP). Experimentally, microcavity heights of 300, 800, and 2000 μm were used. In RFP, the occurrence of breakdown becomes probabilistic when the time delay t
d and pulse width t
PW satisfy the condition t
s-min < t
PW < t
s-max. The breakdown probability increases with pulse width, and the probability distributions are roughly exponential and Gaussian at pulse frequencies of 3 and 1000 Hz, respectively. We found the results are attributed to the similar distributions of time delay in RFP and SRP with similar afterglow time and pulse voltage, and the equal distributions of breakdown probability (with pulse width) and cumulative probability of t
d in RFP. The microcavity effect will decrease the breakdown probability under given pulse width and voltage. Additionally, it is found that in RFP the increase of pulse width from 1 to 1000
μ
s will decrease the threshold voltages at 0% and 100% breakdown probabilities, and the threshold voltage difference will decrease simultaneously to around 0, which results in the transition of breakdown feature from probability to certainty. This phenomenon is due to that the reduction of pulse voltage will increase the time delay significantly and meanwhile the variation rate of time delay with pulse voltage Δt
d/ΔU
w decreases sharply. The microcavity effect will cause the increase of threshold breakdown voltages at a given pulse width and frequency. Finally, it is found that in RFP the breakdown voltage will decrease with the rise of pulse frequency from 10° to 104 Hz, which is consistent with the variation of time delay with afterglow time (from 10−1 to 103 ms) in the memory curve measured in SRP under similar afterglow time. Overall, the microcavity effect will enhance the adsorption of charged and excited species by dielectric walls during afterglow period and enlarge the time delay in the following pulse breakdown, and then influence the RFP breakdown characteristics.