Abstract
Abstract
As an ultra-wide bandgap semiconductor, hexagonal boron nitride (h-BN) has drawn great attention in solar-blind photodetection owing to its wide bandgap and high thermal conductivity. In this work, a metal-semiconductor-metal structural two-dimensional h-BN photodetector was fabricated by using mechanically exfoliated h-BN flakes. The device achieved an ultra-low dark current (16.4 fA), high rejection ratio (R
205nm/R
280nm = 235) and high detectivity up to 1.28 × 1011 Jones at room temperature. Moreover, due to the wide bandgap and high thermal conductivity, the h-BN photodetector showed good thermal stability up to 300 °C, which is hard to realize for common semiconductor materials. The high detectivity and thermal stability of h-BN photodetector in this work showed the potential applications of h-BN photodetectors working in solar-blind region at high temperature.
Funder
Yongjiang Talent Introduction Programme of Ningbo
the Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory
Project of the Chinese Academy of Sciences
Science and Technology Major Project of Ningbo
National Key Laboratory of Science and Technology on Advanced Composites
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Cited by
5 articles.
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