Rotational scanning atomic force microscopy
Author:
Funder
Lietuvos Mokslo Taryba
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Link
http://stacks.iop.org/0957-4484/28/i=10/a=10LT02/pdf
Reference25 articles.
1. High-speed atomic force microscopy coming of age
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