A mechanical microscope: High-speed atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1855407
Reference10 articles.
1. Atomic Force Microscope
2. Scanning Probe Evolution in Biology
3. Unfolding Pathways of Individual Bacteriorhodopsins
4. AFM Fabrication of Sub-10-Nanometer Metal-Oxide Devices with in Situ Control of Electrical Properties
5. "Dip-Pen" Nanolithography
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