ELDRS in a wide range of total doses
Author:
Publisher
IOP Publishing
Subject
General Medicine
Link
http://stacks.iop.org/1757-899X/151/i=1/a=012008/pdf
Reference25 articles.
1. ELDRS in Bipolar Linear Circuits: A Review
2. Evaluation of silicon-germanium (SiGe) bipolar technologies for use in an upgraded atlas detector
3. IHP SiGe:C BiCMOS Technologies as a Suitable Backup Solution for the ATLAS Upgrade Front-End Electronics
4. Enhanced Low Dose Rate Sensitivity (ELDRS) tests on advanced SiGe bipolar transistors for very high total dose applications
5. Simulation of Bipolar Transistor Degradation at Various Dose Rates and Electrical Modes for High Dose Conditions
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1. A modified accelerated testing method of ELDRS in extreme-low dose rate irradiation;The European Physical Journal Plus;2020-11
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