The sources of electron-induced contamination in kinetic vacuum systems-Reference-Cited by-同舟云学术

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The sources of electron-induced contamination in kinetic vacuum systems

Published:1954-01 Issue:1 Volume:5 Page:27-31
ISSN:0508-3443
Container-title:British Journal of Applied Physics
language:
Short-container-title:Br. J. Appl. Phys.

Author:

Ennos A E

Publisher

IOP Publishing

Subject

General Engineering

Link

https://iopscience.iop.org/article/10.1088/0508-3443/5/1/307/pdf

Reference5 articles.

1. The origin of specimen contamination in the electron microscope

2. Application of the mass spectrometer to high vacuum problems

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