Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics-Reference-Cited by-同舟云学术

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Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics

Published:2017-05-17 Issue:5 Volume:19 Page:053019
ISSN:1367-2630
Container-title:New Journal of Physics
language:
Short-container-title:New J. Phys.

Author:

Grossmann Martin,Schubert Martin,He Chuan,Brick Delia,Scheer Elke,Hettich Mike,Gusev Vitalyi,Dekorsy Thomas

Funder

Deutsche Forschungsgemeinschaft

China Scholarship Council

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

http://iopscience.iop.org/article/10.1088/1367-2630/aa6d05/pdf

Reference31 articles.

1. Attenuation and velocity of 56 GHz longitudinal phonons in gallium arsenide from 50 to 300 K

2. Characterization of Mechanical and Thermal Properties Using Ultrafast Optical Metrology

3. Intrinsic phonon relaxation times from first-principles studies of the thermal conductivities of Si and Ge

4. Heat Generation and Transport in Nanometer-Scale Transistors

5. Vibrations and thermal transport in nanocrystalline silicon

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4. All-optical generation, detection, and manipulation of picosecond acoustic pulses in 2D semiconductor/dielectric heterostructures;Photonics Research;2023-11-22

5. Deep learning-based identification of characteristic regions for picosecond ultrasonics metrology;Measurement;2023-08

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