Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging-Reference-Cited by-同舟云学术

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Published:2010-03-31 Issue:3 Volume:12 Page:035013
ISSN:1367-2630
Container-title:New Journal of Physics
language:
Short-container-title:New J. Phys.

Author:

Favre-Nicolin V,Mastropietro F,Eymery J,Camacho D,Niquet Y M,Borg B M,Messing M E,Wernersson L-E,Algra R E,Bakkers E P A M,Metzger T H,Harder R,Robinson I K

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Reference60 articles.

1. Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens

2. Reconstruction of the Shapes of Gold Nanocrystals Using Coherent X-Ray Diffraction

3. Three-dimensional mapping of a deformation field inside a nanocrystal

4. Diffraction with a coherent X-ray beam: dynamics and imaging

5. High energy X-ray micro-optics

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