Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Reference40 articles.
1. Silicon Device Scaling to the Sub-10-nm Regime
2. Electronic properties of strained heterostructures
3. Elastically relaxed free-standing strained-silicon nanomembranes
4. Spontaneous Superlattice Formation in Nanorods Through Partial Cation Exchange
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