STEM analysis of deformation and B distribution In nanosecond laser ultra-doped Si1−xBx

Abstract

AbstractWe report on the structural properties of highly B-doped silicon (up to 10 at.% of active doping) realised by nanosecond laser doping. The crystalline quality, lattice deformation and B distribution profile of the doped layer are investigated by scanning transmission electron microscopy followed by high-angle annular dark field contrast studies and geometrical phase analysis, and compared to the results of secondary ions mass spectrometry and Hall measurements. When increasing the active B concentration above 4 at.%, the fully strained, perfectly crystalline, Si:B layer starts showing dislocations and stacking faults. These only disappear around 8 at.% when the Si:B layer is well accommodated to the substrate. With increasing B incorporation, an increasing number of small precipitates is observed, together with filaments with a higher active B concentration and stacking faults. At the highest concentrations studied, large precipitates form, related to the decrease of active B concentration. The structural information, defect type and concentration, and active B distribution are connected to the initial increase and subsequent gradual loss of superconductivity.