Surface recombination velocity on wet-cleaned silicon wafers using heterodyne lock-in ca rrierography imaging: measurement uniqueness investigation-Reference-Cited by-同舟云学术

Surface recombination velocity on wet-cleaned silicon wafers using heterodyne lock-in ca rrierography imaging: measurement uniqueness investigation

Author:

Song Peng^ORCID,Melnikov Alexander^ORCID,Sun Qiming^ORCID,Pagliaro Robert H^ORCID,Sun Xiaogang,Liu Junyan,Mandelis Andreas

Funder

the Program of Introducing Talents of Discipline of Universities

the Foundation for Innovative Research Groups of the National Nature Science Foundation of China

the Natural Science Foundation of China

the Natural Sciences and Engineering Research Council of Canada (NSERC) for a Discovery grant

the Canada Research Chairs Program

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

Reference23 articles.

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