Abstract
Abstract
We performed synchrotron radiation x-ray topography (XRT) and reticulography to observe dislocations and crystal misorientation at domain boundaries (DBs) in a scandium magnesium aluminate single-crystal substrate grown via the Czochralski method. By inserting a fine-scale x-ray-absorbing mesh between the sample and the topograph-recording medium, reticulography was clearly observed allowing for direct measurement of twist and tile domain misorientation >5 × 10−5 rad. The results show that the angular resolution can be further improved to better than 2 × 10−5 rad by applying a different mesh-to-film distance M and then comparing the relative displacement in their reticulographs. The character of dislocations aligning at the DBs revealed by XRT analysis is consistent with the reticulography results. Finally, we demonstrate a method that combines reticulography and XRT into a single reticulographic XRT image, from which dislocation observation and misorientation measurement can be performed simultaneously.
Funder
Murata Science Foundation
Nippon Sheet Glass Foundation for Materials Science and Engineering
Kazuchika Okura Memorial Foundation
Japan Society for the Promotion of Science
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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