Defect generation behavior in Czochralski-grown ScAlMgO4 crystal using synchrotron X-ray topography

Author:

Ishiji Kotaro,Fujii Takashi,Araki Tsutomu,Shiraishi Yuji,Fukuda Tsuguo

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference48 articles.

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4. X-ray topographic imaging of (Al, Ga)N/GaN based electronic device structures on SiC;Kirste;Appl. Surf. Sci.,2006

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